Young Hwan Lho, Ki Yup Kim
International Journal of Aeronautical and Space Sicences, vol. 5, no. 2, pp.28-34, 2004

Abstract : One of the major problem encountered in nuclear plants and satellites design is EMI (Electro-Magnetic Interference) and EMC (Electro-Magnetic Compatibility). Here, our focus is to implement the test board for checking SEU (Single Event Upsets); the effects of protons on the electronic system. The SEU results from the level change of stored information due to photon radiation and temperature in the space environment. The impact of SEU on PLD (Programmable Logic Devices) technology is most apparent in ROM/SRAM/DRAM devices wherein the state of storage cell can be upset. In this paper, a simple and powerful test techniques is suggested, and the results are presented for the analysis and future reference. In our experiment, the proton radiation facility (having the energy of 50 MeV with a beam current of 60 uA of cyclotron) available at KIRAMS (Korea Institute of Radiological Medical Sciences) has been applied on a commercially available SRAM manufactured by Hynix Semiconductor Company.

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